J. W. Niemantsverdriet - Spectroscopy in Catalysis: An Introduction (2nd edition)
Published: 2000-10-10 | ISBN: 352730200X | PDF | 324 pages | 17.82 MB
'Spectroscopy in Catalysis' describes the most important modern analytical techniques used to investigate catalytic surfaces. These include electron spectroscopy (XPS, UPS, AES, EELS), ion spectroscopy (SIMS, SNMS, RBS, LEIS), vibrational spectroscopy (infrared, Raman, EELS), temperature-programmed techniques (TPR, TPO, TDS), diffraction (XRD, LEED, EXAFS), and microscopy (TEM, SEM, STEM, STM, AFM, FEM, and FIM). Each chapter uses current applications to illustrate the type of information that the technique provides and evaluates its possibilities and limitations.
This second edition includes significant new developments, for example scanning probe microscopies, the imaging and vibrational techniques have been revised, the case studies expanded with an example on polymerization catalysts, and all the other chapters updated with recent examples and relevant new literature.